Description

This instrument provides a useful, progressive indication of coating thickness during the coating process, making reproducible coatings possible. The thickness of both evaporated or sputter coated films can be monitored by this instrument. Its function is based on quartz crystals which oscillate at varying rates depending on the thickness of a coating and some constant factors, such a size of the crystal and the electric current applied.

The sensor head is a water cooled non-magnetic housing which is permanently positioned in the vacuum system. Crystal face is parallel to the water tubes.

The QO 40A1 is mounted on the DN 40CF flange with two 3 tubes and Microdot S-50 coaxial connector.

Note:
Dimensions and ranges shown in specifications and drawings may be changed for an individual customer needs.