ELECTRON Source ES 40C1

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Description

The Electron Source ES 40C1 is a scanable electron source with small spot profile. Due to the high transmission of its Einzel-Lens, the ES 40C is an electron source which gives high electron beam current over a wide energy range. The source can be adapted to a customer requirements regarding the insertion depth and the source shielding material (µ-metal or copper).

Application

The ES 40C1 is designed for a stable and reliable operation in such applications like: AES, scanning applications, imaging, EELS and electron pulse or desorption experiments.

Additional information

Customized insertion depth
Standard or mu-metal shielding
Fine focus microformed tip cathode
Electron Source Power Supply ES40C-PS
Linear Shift (optional)

Specification

Energy range	20 eV ÷ 5 keV
Sample current	up to 100 μA
Scan area	10x10 mm˛
Insertion depth	min. 154 mm, OD: 33.5 mm
Mounting flange	DN 40CF
Max bakeout temp.	250ºC
Standard workind distance	32 mm

Note:
Dimensions and ranges shown in specifications and drawings may be changed for an individual customer needs.

This website is not an offer within the meaning of the Civil Code, and has information character only. Contact with our specialist before you order, please.