Analytical systems

ARPES UHV system [project 418]

The Ultra-high resolution Angle Resolved Photoemission Spectroscopy (ARPES) system.

Transferring system:

Flag Style sample holder

System configuration:

- Analysis chamber with double mu-metal liner guaranteed residual magnetic field lower than 0,1 microTesla and base pressure range 5*10-11 mbar include:

  • Close cycle High resolution manipulator with LHe cooling (temperature on the sample down to 15K) – full motorized
  • Optimized for extremely demanded applications, high precision ARPES electron analyzer
  • Monochromatic UV source for UPS measurement with dedicated pumping system

- Load Lock chamber allows loading up to 12 Flag style sample holder

- Preparation chamber mounted on the top of analysis chamber which allows using one manipulator for both chamber, include:

  • Ion sputter source for sample cleaning
  • Deposition rate measurement system: Quartz Balance and Thickness monitor
  • Gold evaporator (Effusion cell)
  • LEED with multichannel plate for Leed /Auger measurement

- Storage Chamber including park mechanism for 12 Flag style sample holder

- Radial distribution chamber (UFO) for transferring the samples are transferred between chambers under UHV pressures

- Accessories:

  • Set of dedicated, multifunctional, multimaterial sample holders
  • Special rack for all electronics unit
  • Special design bakeout system

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A analytical UHV system HV system dedicated for investigation of the chemical and physical properties of solid state surfaces in wide temperatures and UHV conditions.

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Multitechnique UHV system offering a wide range of surface characterisation techniques including XPS, UPS, ARPES, LEED.

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» Components

Hemispherical Energy Analyser EA15-HP50

» Hemispherical Energy Analyser EA15-HP50

The EA15-HP50 allows high-resolution PES measurements in static and dynamic environments up to 50 mbar.

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PTS 1000 IR RES/C-K sample holder

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The PTS 1000 IR RES/C-K Sample Holder is designed specifically for optical transmission spectroscopy (IR, UV) over the temperature range –170°C to 1000°C.

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PTS 1000 RES/C WITH EXTRA CONTACT sample holder

» PTS 1000 RES/C WITH EXTRA CONTACT sample holder

PTS 1000 RES/C-K sample holder with extra contacts is specifically for use in the MBE Chamber.

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PTS QUARTZ sample holder

» PTS QUARTZ sample holder

The PTS QUARTZ sample holder is equipped with integrated quartz balance for deposition rate measurements.

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» Electronics

Thickness Monitors Controller TMC-13

» Thickness Monitors Controller TMC-13

Newest technology electronics designed for monitoring and controlling any coating and deposition processes.

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Research Unit Digital Instrument RUDI-8M

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Modular, compact high voltage power supply for e.g. photoemission applications.

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X-ray Cooling Controller XRCB-02

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The XRCB-02 Cooling Controller is mainly used to cooling control of the X-ray sources.

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X-ray High Voltage Power Supply XRHV01-PS

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High voltage power supply for X-ray source RS 40B1.

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» Software

Synthesium

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Control and data acquisition software dedicated to EA15 class analysers.

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Used to control the power, preparing a recipe for heating and acquisition of measured data.

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