Analytical systems

UHV-HP AFM System [project 539]

UHV-HP AFM platform is a unique analysis system for Atomic Force Microscopy working in wide pressure range. It is focused on a highly flexible sample environment, dedicated for use in frontier research on gas-solid interfaces. The System is equipped with fast entry load-lock and preparation chamber.

  • AFM chamber - made of stainless steel, with connecting flanges in different size for current and further equipment. Operational pressure range from 1 atm to UHV (after bakeout at 150 ºC),
  • Special sliding rails for AFM module to facilitate service access to the microscope,
  • Load Lock chamber allows for loading and store up to 4 flag style sample holders and 4 cantilevers (tips),
  • Two-level preparation chamber with 4-axes manipulator (with integrated quartz balance and heating possibility up to 1000 °C),
  • Preparation chamber equipped with Electron Beam Evaporator EBV 40A1 and Ion Source IS 40C1 for sample surface cleaning,
  • Special design pumping system - vibration isolation of forevacuum and turbomolecular pump,
  • Deposition rate measurement system TMC13 and Sample Heating Power Supply HEAT3-PS to control and stabilize the sample temeperature,
  • Whole pumping & gas dosing systems are controlled by PLC controller,
  • User-friendly linear transferring system.

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» Systems

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ARTOF Analysis System [project 390]

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Dedicated system for ARTOF experiments with controllable sample temperature from 7 K to 400 K (PID controlled).

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Multichamber UHV system [project 080]

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Multichamber UHV system dedicated to preparation of thin layers and complex analysis of surface solid samples with scanning probe microscopy and other research methods.

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UHV-HP AFM System [project 539]

» UHV-HP AFM System [project 539]

A unique AFM system ready to work in a range from UHV to 1 atm.

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» Components

PTS BASE CONTAINER sample holder

» PTS BASE CONTAINER sample holder

The PTS BASE CONTAINER SAMPLE HOLDER is designed as an adapter to accept samples up to 50mm diameter and 7.5mm thick.

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PTS CLEAV sample holder

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The PTS CLEAV Sample Holder is a version of the PTS CLEAV RES/C-K holder without heating or cooling capabilities.

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1-2 axes MBE Manipulators

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Designed for MBE applications under ultra-high vacuum conditions.

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Analytical Chamber

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Designed for applications requiring the investigation of the chemical and physical properties of solid state surfaces, thin films and nanomaterials.

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» Electronics

UV Source Power Supply UV40A-PS

» UV Source Power Supply UV40A-PS

For controlling the UV source UV40A1 in ultraviolet photoelectron spectroscopy (UPS) applications.

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Flood Source Power Supply FS40-PS

» Flood Source Power Supply FS40-PS

New power supply with touchscreen dedicated for Flood Source FS40A1.

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Thickness Monitors TM13 & TM14

» Thickness Monitors TM13 & TM14

The TM13 and TM14 devices comprise: quartz oscillator, frequency measuring system and communication interface.

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X-ray Source Electronics Set XR40B

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XR40B electronics set is used to control the X-ray source RS 40B1.

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» Software

Application for Thermal Desorption Spectroscopy

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Used to control the power, preparing a recipe for heating and acquisition of measured data.

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New software dedicated to vacuum deposition applications.

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Control and data acquisition software dedicated to EA15 class analysers.

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