Analytical systems for synchrotrons

Super resolution ARPES system [project 158]

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Description

Customised multi-chamber UHV system dedicated for investigation of physical properties (electronic band structure) of high temperature superconductors.

Central radial distribution chamber with attached analytical chamber and auxiliary chambers allows transport of samples under true UHV conditions (pressure
Multitechnique analytical chamber integrates different surface analysis methods like ARPES, UPS and LEED. Fabricated from mu-metal and designed for energy resolution better then 0.5 meV
Can be used in the laboratory as well as on a synchrotron beam line.
Horizontally mounted analyser can be easily rotated by 90 degrees.
The frame has easy height and x-y adjustment for quick and easily reproduced alignment to an external light source (synchrotron or LASER)

Related products

» Systems

» XANELS XPS ultra high vacuum system [project 043]

UHV system designed to operate as both a stand-alone device or as an end station in synchrotron installations.

» Multichamber UHV system [project 288]

Multichamber UHV system.

» ARTOF Analysis System [project 390]

Dedicated system for ARTOF experiments with controllable sample temperature from 7 K to 400 K (PID controlled).

» PLD system [project 465]

Combinatorial, high-throughput Pulsed Layer Deposition system for oxides and nitrides.

» Components

» PTS CLEAV sample holder

The PTS CLEAV Sample Holder is a version of the PTS CLEAV RES/C-K holder without heating or cooling capabilities.

» PTS SPM CLEAV sample holder

The PTS SPM Cleav sample holder combines sample cleaving capabilities with SPM compatibility over the temperature range -170°C to 600°C (indirectly heated).