Analytical systems for synchrotrons

Super resolution ARPES system [project 158]

Description

Customised multi-chamber UHV system dedicated for investigation of physical properties (electronic band structure) of high temperature superconductors.

  • Central radial distribution chamber with attached analytical chamber and auxiliary chambers allows transport of samples under true UHV conditions (pressure
  • Multitechnique analytical chamber integrates different surface analysis methods like ARPES, UPS and LEED. Fabricated from mu-metal and designed for energy resolution better then 0.5 meV
  • Can be used in the laboratory as well as on a synchrotron beam line.
  • Horizontally mounted analyser can be easily rotated by 90 degrees.
  • The frame has easy height and x-y adjustment for quick and easily reproduced alignment to an external light source (synchrotron or LASER)

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» Components

PTS CLEAV RES/C-K sample holder

» PTS CLEAV RES/C-K sample holder

The PTS CLEAV RES/C-K is specifically designed for sample cleaving.

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Wobble Sticks with Cleaver

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3-axis manipulator dedicated to cut the sample in UHV chambers.

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Thermal Desorption Spectrometer TDS 40A1

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The TDS 40A1 is designed for Temperature Programmed Desorption (TPD) applications.

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Load Lock Chamber

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Provides a fast and clean method of introducing samples into UHV systems.

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» Electronics

X-ray Source Electronics Set XREC20

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XREC20 electronics set dedicated for controlling SAX X-ray sources.

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» Software

Spectrium

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Control and data acquisition software dedicated to EA15 class analysers.

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Synthesium

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New software dedicated to vacuum deposition applications.

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