Analytical systems for synchrotrons

Super resolution ARPES system [project 158]

Description

Customised multi-chamber UHV system dedicated for investigation of physical properties (electronic band structure) of high temperature superconductors.

  • Central radial distribution chamber with attached analytical chamber and auxiliary chambers allows transport of samples under true UHV conditions (pressure
  • Multitechnique analytical chamber integrates different surface analysis methods like ARPES, UPS and LEED. Fabricated from mu-metal and designed for energy resolution better then 0.5 meV
  • Can be used in the laboratory as well as on a synchrotron beam line.
  • Horizontally mounted analyser can be easily rotated by 90 degrees.
  • The frame has easy height and x-y adjustment for quick and easily reproduced alignment to an external light source (synchrotron or LASER)

Related products

» Systems

PLD system [project 465]

» PLD system [project 465]

Combinatorial, high-throughput Pulsed Layer Deposition system for oxides and nitrides.

read more
Super resolution ARPES system [project 158]

» Super resolution ARPES system [project 158]

Customised multi-chamber UHV system dedicated for investigation of physical properties (electronic band structure) of high temperature superconductors.

read more
High resolution UPS and XPS system [project 317]

» High resolution UPS and XPS system [project 317]

The UHV ESCA system dedicated for investigation of the chemical and physical properties of solid state surfaces in wide temperature and pressure ranges by different methods under very well controlled conditions.

read more
Multichamber ARPES UHV system [project 072]

» Multichamber ARPES UHV system [project 072]

A system  designed for ARPES research

read more
See more  ›

» Components

Beam Flux Monitor

» Beam Flux Monitor

The Beam Flux Monitor enables measurement of the beam equivalent pressure (BEP) in MBE applications.

read more
X-ray Source with Monochromator RMC50

» X-ray Source with Monochromator RMC50

Based on ellipsoidal quartz crystal and operates according to Bragg Law of X-ray diffraction.

read more
Goniometers

» Goniometers

The precision, 2-axes goniometric stage designed specifically for detectors.

read more
Linear Shifts

» Linear Shifts

UHV transfer mechanism fabricated from a pair of flanges, connected by an edge welded bellows.

read more
See more  ›

» Electronics

X-ray Source Emission Controller XR40B-EC

» X-ray Source Emission Controller XR40B-EC

The XR40B-EC electronic unit controls the X-ray source emission current.

read more
Thickness Monitors TM13 & TM14

» Thickness Monitors TM13 & TM14

The TM13 and TM14 devices comprise: quartz oscillator, frequency measuring system and communication interface.

read more
Bakeout Control Unit BCU14

» Bakeout Control Unit BCU14

Perfect unit dedicated for heating zones of the vacuum systems as well as heating samples inside the preparation chambers.

read more
Vacuum Chamber Highlight VCH-10

» Vacuum Chamber Highlight VCH-10

Perfect accessory for illuminating sample areas, source/accessory positions and movement regions within a UHV system.

read more
See more  ›

» Software

Application for Thermal Desorption Spectroscopy

» Application for Thermal Desorption Spectroscopy

Used to control the power, preparing a recipe for heating and acquisition of measured data.

read more
Synthesium

» Synthesium

New software dedicated to vacuum deposition applications.

read more
Spectrium

» Spectrium

Control and data acquisition software dedicated to EA15 class analysers.

read more
See more  ›

TOP

Important:
this site uses cookie files.

We use information saved in cookie files, among others, in statistical purposes and in order to fit the service to individual needs of the user. In your browser you can change your cookie files settings.

Using the site without changing cookie files settings means they will be saved in device memory. More information with tips how to change settings can be found in Privacy policy.

Close

Query list

Ask