Quartz Balance QO 40A1
Technical data
| Mounting flange | DN 40CF (rotatable) |
| Max. operation temperature | up to 300°C (with water cooling) |
| Water cooling (required) | water flow > 0.5 l/min temperature: 20 - 30 °C max pressure: 6 bar |
| Crystal frequency | 4.8 - 6 MHz, 14 mm diameter (industry standard) |
| Insertion length | dependent on specification and geometry of the chamber |
| Bakeout temperature | up to 150 °C |
The Quartz Balance QO 40A1 instrument provides a real-time, progressive indication of coating thickness during deposition, allowing the production of coatings of high accuracy and reproducibility.
The thickness of both evaporated and sputter coated films can be monitored. The sensor head is a water cooled, non-magnetic housing which is permanently positioned in the vacuum system. The crystal face is parallel to the water cooling feedthrough pipes. The Quartz Balance QO 40A1 is mounted on a DN 40CF flange with two Ø6 pipes and Microdot S-50 coaxial connector. Customized insertion length 130 - 500 mm (other on request).
Features
- Water-colled sensor head
- Easy exchangeable quartz
Options
- Customised insertion length
- With or without integrated manual/electro-pneumatic shutterDifferent mounting flanges (e.g. DN 40 KF)
- Other quartz balance geometries on request (e.g. perpendicular head geometry)
- Linear shift
Watch video tutorial
Quartz Balance QO40AA1: Replacement of quartz crystal
Related products
» Electronics
» Thickness Monitors Controller TMC-13
Newest technology electronics designed for monitoring and controlling any coating and deposition processes.
read more
» Thickness Monitors TM13 & TM14
The TM13 and TM14 devices comprise: quartz oscillator, frequency measuring system and communication interface.
read more
